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Thin-Film Metrology

Thin-Film Metrology news and technical articles from Laser Focus World. Search Thin-Film Metrology latest and archived news and articles

  1. THIN-FILM METROLOGY : Innovations in ellipsometry facilitate thin-film analysis

    Article

    Sat, 1 Nov 2008

    An advanced thin-film metrology tool based on spectroscopic ellipsometry and dedicated to the measurements of blank and patterned wafers is designed to reduce the need for modeling while providing accurate and reliable results.

  2. THIN-FILM METROLOGY : Spectroscopic ellipsometer becomes industrial thin-film tool

    Print

    Thu, 1 Jun 2006

    … reliability of the results obtained by SE. Nondestructive, fast, and easy to use, SE is an excellent candidate for thin - film metrology . When compared to other polarization techniques, the use of phase modulation allows rapid monitoring of transparent …

Related Topics:

  1. Metrology
  2. Modeling Program
  3. Processing Software
  4. Mid-Ir
  5. Diamond Turned
  6. Measurements
  1. THIN-FILM METROLOGY : Ellipsometry provides detailed analysis of infrared optical thin films

    Print

    Sun, 1 Aug 2010

    Modern IR-spectroscopic ellipsometry instruments and data analysis software provide accurate and repeatable thickness and optical property measurements of substrates and film samples.

  2. THIN-FILM METROLOGY : Ellipsometry provides detailed analysis of infrared optical thin films

    Article

    Sun, 1 Aug 2010

    Modern IR-spectroscopic ellipsometry instruments and data analysis software provide accurate and repeatable thickness and optical property measurements of substrates and film samples.

  3. THIN-FILM METROLOGY : Reflection, transmission spectrophotometry characterizes OLED materials

    Print

    Mon, 1 Aug 2005

    The spectacular growth of the organic-light-emitting-device (OLED) industry over the past couple of years has highlighted the technical challenges faced in the manufacturing of these devices.

  5. Wafer mapper measures thin-film thickness

    Print

    Wed, 1 Mar 1995

    … an old technique, engineers at Hughes Danbury Optical Systems (HDOS, Danbury, CT) have created a powerful thin - film metrology device for silicon-wafer manufacturers that can provide data on entire wafers in less than two minutes. The …

  6. New Products

    Print

    Wed, 1 Jun 2005

    Spectrophotometer; Thin-film metrology ; Dye laser; MORE...

  7. Ultrafast, THz, fiber lasers focus of Marketplace Seminar Technology Forum

    Article

    Thu, 5 Jan 2012

    … semiconductors; multi-photon and fluorescence lifetime imaging microscopy; ophthalmology, surgery, and dissection; thin - film metrology and mask repair; and tasks such as satellite laser ranging, THz generation, and spectroscopy. Huber discusses …

  8. Ultrafast lasers find industrial and medical uses

    Print

    Sat, 1 May 1999

    … applications in noncontact thin - film metrology , as well as significant potential ..... materials processing. Ultrasonic thin - film metrology In the semiconductor industry ..... supplied picosecond ultrasonic thin - film metrology systems incorporating an ultrafast …

  9. OPTICAL PROFILING: Modern optical surface profilers combine multiple techniques into a single, streamlined, user-friendly package

    Article

    Thu, 16 Dec 2010

    … metrology: nondestructive measurement combined with high accuracy. By supplementing optical profiling systems with thin - film metrology capability, analysis algorithms, microdisplay technology in the optical path, and a compact sensor head, this …

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